Understanding the structure of any material is highly important for any kind of device application. This is especially crucial at the interfaces of heterostructures, which become further complicated in low dimensional structures due to the presence of atomic disorder (called defects) either by self-rearrangement of atoms during growth or by intentional introduction of foreign impurities. To know the microstructures and the involved elements, even for elemental mapping, transmission electron microscopy (TEM) has commonly been used, though it requires specialized sample preparation tools for examining thin films in cross-section. The aim of this lab is, therefore, to carry out detailed microstructural analysis using various modes of TEM such as HRTEM, STEM, EDS, etc.This facility is being developed.
Block A, Ground Floor, Room: A001