Atomic Force Microscope (AFM)

Make: Oxford Instrument (Asylum Research)

Model: MFP3D-Origin

Year of Installation: 2023


  • Standard X and Y range 120 μm X and Y sensors <0.6 nm noise Z range >15 μm
  • Z sensor <0.25 nm noise
  • Igor Pro software analysis
  • Sample size Up to 80 mm diameter Sample thickness Up to 10 mm (up to 27 mm option)

Operational Modes

  • Contact mode
  • Tapping mode
  • Piezoelectric Force Microscopy Mode


Soft and hard material characterizations include thin films, nanoparticles, nanotubes, conductive polymers, bio-conjugates, viruses, ferroelectric and piezoelectric materials etc.

User Instruction:

  • Must submit the requisition
  • External users should apply through

AFM charges:


Govt. and private academic institutions: INR 1000+18% GST

Industry: INR 1500 +18% GST


Govt. and private academic institutions: INR 1500+18% GST

Industry: INR 2500 +18% GST

*sample should be deposited on a substrate and dried properly


Shiv Nadar IoE Campus

Contact Person

[email protected]

[email protected]