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Department of Electrical Engineering
Nilesh Goel
Assistant Professor,
Department of Electrical Engineering (Office C-318F),
School of Engineering
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Education Details
  • B.Tech. (2003-2007) in Electronics and Communication Engineering from Motilal Nehru NIT Allahabad.
  • Ph.D. (2011-2015) in Electrical Engineering from IIT Bombay
Professional Experience
  • July 2007 to October 2010 as Design Engineer at ST Microelectronics Greater NOIDA.
  • May 2015 to Oct 2016 as Staff Device Engineer at SanDisk India Device Design Centre Bangalore.
  • From Oct 2016 till date as Assistant Professor in Electrical Engineering Department at SNU.
Research Interests
  1. Semiconductors: Semiconductor device reliability, device characterization, modelling and simulation; compact modelling and circuit simulation, reliability aware circuit design; flash and other storage class memories.
  2. Education Methodologies: Strong interest in developing tools, technology and teaching methodologies based on visualization, hands on experience, developing analogies to illustrate difficult concepts.
Select Publications
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Book Chapters:

Author/Co-author for 5 chapters in a book “Fundamentals of Bias Temperature Instability in MOS Transistors” Edited by Prof. Souvik Mahapatra (published by Springer).

  1. Introduction: Bias Temperature Instability (BTI) in N and P channel MOSFETs” Souvik Mahapatra, Nilesh Goel and Subhadeep Mukhopadhyay
  2. Characterization methods for BTI degradation and associated gate insulator defects” Souvik Mahapatra, Nilesh Goel, Ankush Chaudhary, Kaustubh Joshi and Subhadeep Mukhopadhyay
  3. Physical mechanism of BTI degradation – modeling of process and materials dependence” Souvik Mahapatra, Kaustubh Joshi, Subhadeep Mukhopadhyay, Ankush Chaudhary and Nilesh Goel
  4. Reaction-Diffusion model” Ahmad Ehteshamul Islam, Nilesh Goel, Souvik Mahapatra and Muhammad Ashraful Alam
  5. Modeling of DC and AC NBTI degradation and recovery for SiON and HKMG MOSFETsNilesh Goel and Souvik Mahapatra.
Journal Publications (Published/submitted):
  1. S. Mukhopadhyay, N. Goel, S. Mahapatra, “A Comparative Study of NBTI and PBTI Using Different Experimental TechniquesIEEE Transactions on Electron Devices (TED), Oct. 2016.
  2. N. Parihar, N. Goel, Ankush Chaudhary, S. Mahapatra “A Modeling Framework for NBTI Degradation under Dynamic Voltage and Frequency ScalingIEEE Transactions on Electron Devices (TED), Mar. 2016.
  3. N. Goel, K. Joshi, S. Mukhopadhyay, N. Nanaware, S. Mahapatra, “A Comprehensive Modeling Framework for Gate Stack Process Dependence of DC and AC NBTI in SiON and HKMG p-MOSFETs.” Microelectronics Reliability (MR), Feb. 2014. (Introductory Invited Paper).
  4. K. Joshi, S. Mukhopadhyay, N. Goel, N. Nanaware, S. Mahapatra, "A Detailed Study of Gate Insulator Process Dependence of NBTI Using a Compact Model,", IEEE Transactions on Electron Devices (TED)s, Feb. 2014.
  5. N. Goel, N. Nanaware, S. Mahapatra, "Ultrafast AC–DC NBTI Characterization of Deep IL Scaled HKMG p-MOSFETs" IEEE Electron Device Letters (EDL), Dec. 2013.
  6. S. Mahapatra, N. Goel, S. Desai, S. Gupta, B. Jose, S. Mukhopadhyay, K. Joshi, A. Jain, A. E. Islam, M. A. Alam, “A Comparative Study of Different Physics Based NBTI ModelsIEEE Transactions on Electron Devices (TED), 2013. (Invited Paper)
Conference Publications:
  1. Nilesh Goel, Vinuthna Vinjamuri, Harvijay Singh, Arum M., Xiying Costa and Dana Lee, “Impact of Endurance Rate on Program Erase Cycles,” International SanDisk Technology Conference (ISTC 2016), Milpitas (CA).
  2. Nilesh Goel, T. Naphade, S. Mahapatra, “Combined Trap Generation and Transient Trap Occupancy Model for Time Evolution of NBTI during DC Multi-Cycle and AC Stress,” IEEE International Reliability Physics Symposium (IRPS), 2015.
  3. Nilesh Goel, P. Dubey, J. Kawa, S. Mahapatra, “Impact of Time-Zero and NBTI Variability on Sub-20nm FinFET Based SRAM at Low Voltages,” IEEE International Reliability Physics Symposium (IRPS), 2015.
  4. Nilesh Goel, S. Mukhopadhyay, N. Nanaware, S. De, R. K. Pandey, K. V. R. M. Murali, S. Mahapatra, “A Comprehensive DC/AC Model for Ultra-Fast NBTI in Deep EOT Scaled HKMG p-MOSFETs,” IEEE International Reliability Physics Symposium (IRPS), 2014.
  5. T. Naphade, P. Verma, N. Goel, S. Mahapatra, “DC / AC BTI Variability of SRAM Circuits Simulated Using a Physics-Based Compact Model,” IEEE International Reliability Physics Symposium (IRPS), 2014.
  6. S. Mukhopadhyay, K. Joshi, V. Chaudhary, N. Goel, S. De, R. K. Pandey, K. V. R. M. Murali, S. Mahapatra, “Trap Generation in IL and HK Layers During BTI/TDDB Stress in Scaled HKMG N and P MOSFETs” IEEE International Reliability Physics Symposium (IRPS), 2014.
  7. T. Naphade, N. Goel, P. R. Nair and S. Mahapatra, “Investigation of Stochastic Implementation of Reaction-Diffusion (RD) Model for NBTI Related Interface Traps,” IEEE International Reliability Physics Symposium (IRPS), 2013.
  8. S. Desai, S. Mukhopadhyay, N. Goel, N. Nanaware, B. Jose, K. Joshi and S. Mahapatra, “A Comprehensive AC/DC NBTI Model: Stress, Recovery, Frequency, Duty Cycle and Process Dependence” IEEE International Reliability Physics Symposium (IRPS), 2013.
  9. K. Joshi, S. Mukhopadhyay, N. Goel, S. Mahapatra, “A Consistent Physical Framework for N and P BTI in HKMG MOSFETs,” IEEE International Reliability Physics Symposium (IRPS), 2012.
  10. S. Mahapatra, N. Goel, K. Joshi, “A physics-based model for NBTI in p-MOSFETs” Proc. Int. Conf. on Solid-State and Integrated Circuit Technology (ICSICT), 2012.
Other Publications / Presentations before Doctorate:
  1. R. K. Nandwana, M. Arrawatia, N. Goel, “Design of low-voltage high-performance CMOS-Current feedback amplifier using indirect feedback compensated Op-Amp,” IEEE 8th International Conference on ASIC (ASICON), Oct. 2009
  2. A. Agarwal, N. Goel, S. Bannerjee, C. V. Singh, H. N. Kar, “Detection of Audio Source Using Direction Detection Robot,” Oral presentation at the International Conference on Emerging Mechanical Techno-logy-Macro to Nano EMTM2N-2007, 16-18 Feb. 2007 at BITS, Pilani.
  3. N. Goel, A. Agarwal, S. Bannerjee, C. V. Singh “An Operator Interface for an Autonomous Mobile System” Got First prize in Eureka, a student paper presentation contest during Techkriti 2007, annual all India level technical festival organized by IIT Kanpur.
  4. A. Agarwal, N. Goel, S. Bannerjee, “Tracking of Audio Source using an Autonomous Mobile Robot” Got First prize in Student Paper Contest, at IEEE sponsored 2nd International Conference on Wireless Communication & Sensor Networks, INDIA, 17-19 Dec. 2006.
Executive Summary
Prof. Nilesh Goel has more than five years of industry experience with strong theoretical and experimental skill in the field of semiconductors device characterization, modelling of reliability. He has strong bend towards innovation and product design.

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